Scanning Electron Microscope to Evaluate the Morphological and Microchemical Changes

  • Verdés Orlando, Pacheco Hernández, Padrón Herrera, Yunier López


Scanning Electron Microscopy provides a description of the physics of electron-probe 
formation and of electron-specimen interactions. A scanning electron microscope scans a focused electron beam over a surface to create an image. The electrons in the beam interact with the sample, producing various signals that can be used to obtain information about the surface topography and composition. The objective of this research work is to evaluate the morphological and microchemical changes by using scanning electron microscope.